![DISTRIBUTED DELAY-LINE FOR LOW-COHERENCE INTERFEROMETRY](/ep/2018/06/27/EP3338051A1/abs.jpg.150x150.jpg)
基本信息:
- 专利标题: DISTRIBUTED DELAY-LINE FOR LOW-COHERENCE INTERFEROMETRY
- 申请号:EP16757209.8 申请日:2016-08-19
- 公开(公告)号:EP3338051A1 公开(公告)日:2018-06-27
- 发明人: SANCHO DURÁ, Juan , MARTIN, Alberto , RUBIO GIVERNAU, José Luis , MARGALLO BALBÁS, Eduardo
- 申请人: Medlumics S.L.
- 申请人地址: Ronda de Pontiente 6 2A-B 28760 Tres Cantos ES
- 专利权人: Medlumics S.L.
- 当前专利权人: MEDLUMICS S.L.
- 当前专利权人地址: MEDLUMICS S.L.
- 代理机构: Carvajal y Urquijo, Isabel
- 优先权: US201562207049P 20150819; US201615237299 20160815
- 国际公布: WO2017029386 20170223
- 主分类号: G01B9/02
- IPC分类号: G01B9/02 ; G02B6/12 ; G02B6/28 ; G02B6/43 ; A61B3/10
摘要:
A Time Domain Optical Coherence Tomography system using a modulation scheme multiplexes the scanning range of the delay line into different spectral bands. Such a modulation scheme may allow for power consumption reduction compared with a single delay line element since the same modulation pattern is being used for several channels. In an example, the optical coherence tomography system may include a plurality of stages, each stage having a group delay element. The distinct group delays may be introduced to scan a sample with distinct electrical frequency bands at distinct axial scanning depth ranges.
公开/授权文献:
- EP3338051B1 DISTRIBUTED DELAY-LINE FOR LOW-COHERENCE INTERFEROMETRY 公开/授权日:2021-07-21
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01B | 长度、厚度或类似线性尺寸的计量;角度的计量;面积的计量;不规则的表面或轮廓的计量 |
------G01B9/00 | 组中所列的及以采用光学测量方法为其特征的仪器 |
--------G01B9/02 | .干涉仪 |