基本信息:
- 专利标题： INSPECTION SYSTEM
- 专利标题（中）：检验系统
- 申请号：EP17159082.1 申请日：2017-03-03
- 公开(公告)号：EP3264072A1 公开(公告)日：2018-01-03
- 发明人： KIMURA, Yuki , MATSUI, Akira , INAZUMI, Shingo
- 申请人： Omron Corporation
- 申请人地址： 801 Minamifudodo-cho Horikawahigashiiru Shiokoji-dori Shimogyo-ku Kyoto-shi, Kyoto 600-8530 JP
- 专利权人： Omron Corporation
- 当前专利权人： Omron Corporation
- 当前专利权人地址： 801 Minamifudodo-cho Horikawahigashiiru Shiokoji-dori Shimogyo-ku Kyoto-shi, Kyoto 600-8530 JP
- 代理机构： Piotrowicz, Pawel Jan Andrzej
- 优先权： JP2016130458 20160630
- 主分类号： G01N21/95
- IPC分类号： G01N21/95 ; G01B11/10 ; G01B11/24 ; G01N21/952
摘要：
An inspection system is provided with an inspection device configured to examine the external features of an object; and a control device for controlling the inspection device;
the inspection device including: a substantially column-shaped first barrel (250) that includes a first through hole (260) configured for an object to pass therethrough; and a plurality of imaging units (255) provided on the inner peripheral surface which forms the first through hole in the first barrel; and the control device (401) including: an image processing unit configured to process an image captured and output by each of the imaging units for the purpose of inspection. A substantially column-shaped second barrel (350) can be furhter provided, that includes a second through hole (360) through which the object can pass; and a plurality measurement sensors (353).
摘要（中）：
the inspection device including: a substantially column-shaped first barrel (250) that includes a first through hole (260) configured for an object to pass therethrough; and a plurality of imaging units (255) provided on the inner peripheral surface which forms the first through hole in the first barrel; and the control device (401) including: an image processing unit configured to process an image captured and output by each of the imaging units for the purpose of inspection. A substantially column-shaped second barrel (350) can be furhter provided, that includes a second through hole (360) through which the object can pass; and a plurality measurement sensors (353).
检查系统设置有检查装置，检查装置配置成检查物体的外部特征; 以及用于控制检查装置的控制装置; 所述检查装置包括：大致圆柱形的第一镜筒（250），所述第一镜筒（250）包括被配置用于使物体通过的第一通孔（260） 以及多个成像单元（255），设置在形成第一镜筒中的第一通孔的内周表面上; 以及所述控制装置（401）包括：图像处理单元，被配置为处理由所述成像单元中的每一个捕获并输出的用于检查目的的图像。 基本上为圆柱形的第二筒体（350）可以设置成包括第二通孔（360），物体可以穿过该第二通孔（360）; 和多个测量传感器（353）。
IPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
| ------G01N21/00 | 利用光学手段，即利用红外光、可见光或紫外光来测试或分析材料 |
| --------G01N21/01 | .便于进行光学测试的装置或仪器 |
| ----------G01N21/88 | ..测试瑕疵、缺陷或污点的存在 |
| ------------G01N21/95 | ...特征在于待测物品的材料或形状 |