
基本信息:
- 专利标题: Thermoanalytischer Sensor und Verfahren zu dessen Herstellung
- 专利标题(英):Thermoanalytical sensor and method for its production
- 专利标题(中):Thermoanalytischer传感器和Verfahren zu dessen Herstellung
- 申请号:EP14160420.7 申请日:2014-03-18
- 公开(公告)号:EP2921833A1 公开(公告)日:2015-09-23
- 发明人: Wettstein, Paul , Bendler, Markus
- 申请人: Mettler-Toledo AG
- 申请人地址: Im Langacher 44 8606 Greifensee CH
- 专利权人: Mettler-Toledo AG
- 当前专利权人: METTLER-TOLEDO GMBH
- 当前专利权人地址: METTLER-TOLEDO GMBH
- 主分类号: G01K17/00
- IPC分类号: G01K17/00 ; H05K3/32
A method for manufacturing a thermoanalytical sensor, and a sensor manufactured according to this method, in particular a DSC sensor which comprises a substrate, at least one measuring position, at least one temperature sensor unit and at least one electrical contact point. The temperature sensor unit detects the temperature at the measuring position and is connected via the electrical contact point with a metallic wire for integration in an electronic circuit. The method comprises folgendene steps of: providing the substrate; Generating at least a measurement position, at least one temperature sensor unit and at least one electrical contact point on the top surface of the substrate; Generating a feedthrough in the substrate for contacting the electrical contact point; Introducing a metal wire in the execution of the underside of the substrate is made of; Melting of the upper end of the metallic wire to form a metal ball; Forming a cohesive compound as bonding point between the upper end of the metallic wire and the electrical contact point by the action of pressure and temperature on the metal ball.