
基本信息:
- 专利标题: OPTICAL IMAGE MEASUREMENT INSTRUMENT
- 专利标题(中):OPTISCHESBILDMESSGERÄT
- 申请号:EP08738513.4 申请日:2008-04-08
- 公开(公告)号:EP2138825A1 公开(公告)日:2009-12-30
- 发明人: NISHIO, Yutaka , OKADA, Hiroaki , KIKAWA, Tsutomu , YUMIKAKE, Kazuhiko
- 申请人: Kabushiki Kaisha TOPCON
- 申请人地址: 75-1, Hasunuma-cho Itabashi-ku Tokyo 174-8580 JP
- 专利权人: Kabushiki Kaisha TOPCON
- 当前专利权人: Kabushiki Kaisha TOPCON
- 当前专利权人地址: 75-1, Hasunuma-cho Itabashi-ku Tokyo 174-8580 JP
- 代理机构: Gagel, Roland
- 优先权: JP2007109027 20070418
- 国际公布: WO2008129862 20081030
- 主分类号: G01N21/17
- IPC分类号: G01N21/17 ; A61B3/12
摘要:
A device 1 is an OCT device that splits a low-coherence light L0 into a signal light LS and a reference light LR, detects an interference light LC obtained by superimposing the signal light LS propagated through an eye E and the reference light LR propagated through a reference mirror 174, and forms an image of an fundus oculi Ef. The device 1 has a scan unit 141 that scans the eye E with the signal light LS. When a cross-section position is designated in an fundus oculi image Ef', the device 1 repetitively scans with the signal light LS along each cross-section position to repeatedly forms tomographic images at each cross-section position, thereby displaying a tomographic motion image at each cross-section position on a display 240A. An operator can observe the tomographic motion image to designate the range and timing for measurement of a tomographic still image.
摘要(中):
装置1是将低相干光L0分解为信号光LS和参考光LR的OCT装置,检测通过叠加通过眼睛E传播的信号光LS和通过传播的参考光LR获得的干涉光LC 参考镜174,并形成眼底Ef的图像。 装置1具有用信号光LS扫描眼睛E的扫描单元141。 当在眼底图像Ef'中指定横截面位置时,装置1沿着每个横截面位置用信号光LS重复扫描,以在每个横截面位置处重复形成断层图像,从而显示断层图像运动图像 在显示器240A上的每个横截面位置。 操作者可以观察层析运动图像以指定断层摄影静止图像的测量范围和时间。
公开/授权文献:
- EP2138825B1 OPTICAL IMAGE MEASUREMENT INSTRUMENT 公开/授权日:2014-11-12
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N21/00 | 利用光学手段,即利用红外光、可见光或紫外光来测试或分析材料 |
--------G01N21/17 | .入射光根据所测试的材料性质而改变的系统 |