发明公开
EP2105727A1 Scanning electron microscope comprising a film for holding a sample and a dish for receiving sample material from a damaged film
有权
![Scanning electron microscope comprising a film for holding a sample and a dish for receiving sample material from a damaged film](/ep/2009/09/30/EP2105727A1/abs.jpg.150x150.jpg)
基本信息:
- 专利标题: Scanning electron microscope comprising a film for holding a sample and a dish for receiving sample material from a damaged film
- 专利标题(中):扫描型电子显微镜用薄膜作为样品保持器和用于受损膜的样品材料的收集碗
- 申请号:EP09250792.0 申请日:2009-03-20
- 公开(公告)号:EP2105727A1 公开(公告)日:2009-09-30
- 发明人: Nishiyama, Hidetoshi , Koizumi, Mitsuru
- 申请人: JEOL Ltd.
- 申请人地址: 1-2, Musashino 3-chome Akishima, Tokyo 196-8558 JP
- 专利权人: JEOL Ltd.
- 当前专利权人: JEOL Ltd.
- 当前专利权人地址: 1-2, Musashino 3-chome Akishima, Tokyo 196-8558 JP
- 代理机构: Cross, Rupert Edward Blount
- 优先权: JP2008080186 20080326
- 主分类号: G01N23/225
- IPC分类号: G01N23/225 ; H01J37/20 ; H01J37/26 ; H01J37/28
摘要:
Method and apparatus capable of well observing or inspecting a liquid sample (20). The apparatus, for example a scanning electrode microscope, can be maintained and serviced better than heretofore. The apparatus has a film (32) including a first surface (32a) to hold the liquid sample (20) thereon, a vacuum chamber (11) for reducing the pressure of an ambient in contact with a second surface (32b) of the film (32), primary beam irradiation means (1) connected with the vacuum chamber (11) and irradiating the sample with a primary beam (7) via the film (32), signal detection means (4) for detecting a secondary signal produced from the sample (20) in response to the beam irradiation (7), a partitioning plate (14) for partially partitioning off the space between the film (32) and the primary beam irradiation means (1) in the vacuum chamber (11), and a vacuum gauge (15) for detecting the pressure inside the vacuum chamber (11).
Damage to the film is detected by a pressure increase inside the vacuum chamber. After detecting such a pressure increase the partitioning member is moved in the path of the irradiating beam in order to prevent sample material to spill into the irradiation means.
摘要(中):
Damage to the film is detected by a pressure increase inside the vacuum chamber. After detecting such a pressure increase the partitioning member is moved in the path of the irradiating beam in order to prevent sample material to spill into the irradiation means.
方法和能够很好观察或检查的液体样品(20)装置。 的装置,例如扫描电极显微镜,可以维护和服务比以前更好。 该装置具有一个膜(32)包括第一表面(32A)以保持液体样品(20)在其上,在真空室(11),用于与膜的第二面(32B)减少接触的环境的压力 (32),主光束照射单元(1)与所述真空室(11)连接,并且经由膜照射主光束(7)的样品(32)中,信号检测器,用于检测从产生的次级信号的装置(4) 响应于所述光束照射(7)的样品(20),分隔板(14),用于在真空室中部分分隔从薄膜(32)和初级束照射设备(1)之间的空间(11), 和真空计(15),用于检测所述真空室(11)内的压力。 损坏膜是通过在真空室内部的压力增加来检测。 检测寻求的压力增加分隔构件设置在照射光束的路径移动,以防止样品材料溢出到照射装置之后。
公开/授权文献:
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N23/00 | 利用未包括在G01N21/00或G01N22/00组内的波或粒子辐射来测试或分析材料,例如X射线、中子 |
--------G01N23/02 | .通过使辐射透过材料 |
----------G01N23/225 | ..利用电子或离子微探针 |