基本信息:
- 专利标题： Ic socket
- 专利标题（中）：IC载
- 申请号：EP04009153.0 申请日：2004-04-16
- 公开(公告)号：EP1471357A3 公开(公告)日：2007-01-03
- 发明人： Yanagisawa, Wasuke , Sato, Atsushi , Suzuki, Mitsuhiro , Yoshida, Takuto
- 申请人： Yokowo Co., Ltd
- 申请人地址： 5-11, Takinogawa 7-chome, Kita-ku Tokyo JP
- 专利权人： Yokowo Co., Ltd
- 当前专利权人： Yokowo Co., Ltd
- 当前专利权人地址： 5-11, Takinogawa 7-chome, Kita-ku Tokyo JP
- 代理机构： Weber, Joachim
- 优先权： JP2003121573 20030425
- 主分类号： G01R1/04
- IPC分类号： G01R1/04
摘要：
An IC socket receives an IC provided with arrayed terminals. In the IC socket, a conductive block is formed with a first face opposing to the received IC, and a plurality of holes arrayed in association with the terminals of the received IC. Each of a plurality of contact probes is disposed in each of the holes, and is provided with a conductive pipe, and a conductive plunger, retractably provided at a first end of the pipe, the plunger being to be brought into contact with an associated one of the terminals. A retainer provided with an insulative member through which the pipe is coaxially held within an associated one of the holes while forming a gap between an outer periphery of the pipe and an interior wall of the associated one of the holes. At least one of the contact probes to be brought into contact with an RF signal terminal among the terminals of the received IC is retained by the retainer.
公开/授权文献:
- EP1471357A2 Ic socket 公开/授权日：2004-10-27
IPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01R | 测量电变量；测量磁变量（通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
| ------G01R1/00 | 包含在G01R5/00至G01R13/00和G01R31/00组中的各类仪器或装置的零部件 |
| --------G01R1/02 | .一般结构零部件 |
| ----------G01R1/04 | ..外壳；支承构件；端子装置 |