基本信息:
- 专利标题： METHOD FOR ADDING AN APPARENT NON-SIGNAL LINE TO A RAPID DIAGNOSTIC ASSAY
- 专利标题（中）：加入表观NOT信号线快速诊断试验的方法
- 申请号：EP02798207.3 申请日：2002-09-10
- 公开(公告)号：EP1436592A1 公开(公告)日：2004-07-14
- 发明人： JEROME, Jeremy , DAQUIPA, Mark , JACONO, Bruce , BOEHRINGER, Hans , LAMBOTTE, Paul , LAWRENCE, Paul, J.
- 申请人： QUIDEL CORPORATION
- 申请人地址： 10165 McKellar Court San Diego, California 92121 US
- 专利权人： QUIDEL CORPORATION
- 当前专利权人： QUIDEL CORPORATION
- 当前专利权人地址： 10165 McKellar Court San Diego, California 92121 US
- 代理机构： Price, Nigel John King
- 优先权： US950366 20010910
- 国际公布： WO2003023371 20030320
- 主分类号： G01N21/00
- IPC分类号： G01N21/00 ; C12M1/34
摘要：
A test device and method for determining the presence or absence of one or more analytes in a fluid sample, the test device including a support (14) or member bearing a mark (46)thereon, and a matrix (18) or member containing a capture zone (40). In operation, an observation area (38) in the test device becomes transparent, thereby allowing the user to view a mark that is present on a support that is disposed beneath the observation area. Typically, the mark on the underlying support is configured as a minus (-) sign. In the absence of analyte in the sample, the test device presents a negative result as a minus (-) signal. In the presence of analyte in the sample, however, the mark operates in concert with a perpendicular test line on the observation area to present a positive result as a plus (+) signal that is visible to the user.
IPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
| ------G01N21/00 | 利用光学手段，即利用红外光、可见光或紫外光来测试或分析材料 |