The utility model provides a semiconductor laser testing device. The semiconductor laser testing device comprises a conductor object stage used for bearing a sample, a power supply, an optical system opposite to the conductor object stage as well as a laser light source, an imaging device and a spectrograph which are optically coupled with the optical system, wherein the power supply comprises an anode probe and a cathode probe and is used for outputting working voltage to the sample through the anode probe and the cathode probe so as to enable the sample to perform electroluminescence (EL); the laser light source is used for emitting laser light, and the laser light is projected to the sample through the optical system so as to enable the sample to perform photoluminescence (PL); the imaging device is used for imaging the EL or PL sample through the optical system; and the spectrograph is used for measuring wavelength of the EL or PL sample through the optical system.