
基本信息:
- 专利标题: 吊挂式测量对中装置
- 专利标题(英):Hanging type measuring and centering device
- 申请号:CN201220164120.1 申请日:2012-04-18
- 公开(公告)号:CN202562481U 公开(公告)日:2012-11-28
- 发明人: 康晋明 , 景兆骥 , 殷允涛 , 薛刚 , 邓美龙 , 任春波 , 刘小利 , 刘丹青 , 汪启志 , 康旭东 , 刘玉伟 , 申雄权
- 申请人: 中建交通建设集团有限公司 , 中国建筑一局(集团)有限公司
- 申请人地址: 北京市丰台区西四环南路52号中建一局大厦
- 专利权人: 中建交通建设集团有限公司,中国建筑一局(集团)有限公司
- 当前专利权人: 中建交通建设集团有限公司,中国建筑一局(集团)有限公司
- 当前专利权人地址: 北京市丰台区西四环南路52号中建一局大厦
- 代理机构: 北京中建联合知识产权代理事务所
- 代理人: 朱丽岩; 唐晓丽
- 主分类号: G01C15/00
- IPC分类号: G01C15/00
The utility model relates to a hanging type measuring and centering device. The hanging type measuring and centering device comprises an instrument support platform, hanging pieces and an instrument mounting hole formed in the instrument support platform, wherein the instrument support platform is horizontally arranged, the hanging pieces comprise a vertical hanging piece A, a vertical hanging piece B and an oblique hanging piece, the vertical hanging piece A and the vertical hanging piece B are vertical to the instrument support platform, one end of the vertical hanging piece A is welded and connected with one end of the vertical hanging piece B, a connecting plate which extends outwards freely is welded at the other end of each of the vertical hanging piece A and the vertical hanging piece B, the oblique hanging piece and the instrument support platform are arranged by forming a certain included angle, one end of the oblique hanging piece is connected with the instrument support platform, a connecting plate which extends outwards freely is welded at the other end of the oblique hanging piece, all the connecting plates are arranged in the same plane, and device mounting holes are respectively formed in the connecting plates. The hanging type measuring and centering device can provide the stable support platform for measuring instruments, prevent blocking the visual field of the measuring instruments and eliminate the need of frequently changing a station, has the advantages of simple structure, convenience in assembly and disassembly, repeated utilization and the like, and can be widely applied to measuring and centering at the top parts of structures.
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01C | 测量距离、水准或者方位;勘测;导航;陀螺仪;摄影测量学或视频测量学 |
------G01C15/00 | 不包括在G01C1/00至G01C13/00各组的测量器械或部件 |