![一种用于空间位置精确测量的设备](/CN/2005/1/16/images/200510083495.jpg)
基本信息:
- 专利标题: 一种用于空间位置精确测量的设备
- 专利标题(英):Equipment used for space position precise measurement
- 申请号:CN200510083495.X 申请日:2005-07-29
- 公开(公告)号:CN1904548A 公开(公告)日:2007-01-31
- 发明人: 吴万龙 , 高文焕 , 李元景 , 金永杰 , 胡晓伟
- 申请人: 清华同方威视技术股份有限公司 , 清华大学
- 申请人地址: 北京市清华同方科技广场A座2907
- 专利权人: 清华同方威视技术股份有限公司,清华大学
- 当前专利权人: 清华同方威视技术股份有限公司,清华大学
- 当前专利权人地址: 北京市清华同方科技广场A座2907
- 主分类号: G01B21/04
- IPC分类号: G01B21/04 ; G01B11/03
A kind of equipment used to measure the space location precisely belongs to the application field of the laser photoelectricity measure technique. The invention includes an emission base board, a collimation laser device, a beam regulator, a receiving base board, a supporting bracket, a two-dimension photoelectricity sensor and a signal treating device. The collimation laser device and the beam regulator are connected. The beam regulator is installed on the emission base board and makes the laser beam consistent with the normal of the emission base board to form the laser emission device. The receiving base board is connected with the side end of the supporting bracket. On the supporting bracket installs the gearing, on which installs the two-dimension photoelectricity sensor and the signal treating device. The coordinate center motion locus of the two-dimension photoelectricity sensor detecting surface is consistent with the normal of the receiving base board to form the photoelectricity detecting device. The invention uses the space location measure system of laser photoelectricity and four freedoms to realize the precise measure of the space location relation between the remote objects.
公开/授权文献:
- CN100363712C 一种用于空间位置精确测量的设备 公开/授权日:2008-01-23
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01B | 长度、厚度或类似线性尺寸的计量;角度的计量;面积的计量;不规则的表面或轮廓的计量 |
------G01B21/00 | 不适合于本小类其他组中所列的特定类型计量装置的计量设备或其零部件 |
--------G01B21/02 | .用于计量长度、宽度或厚度 |
----------G01B21/04 | ..通过测量各点的坐标 |