
基本信息:
- 专利标题: 半导体元件的制作方法
- 专利标题(英):Method for fabricating semiconductor element
- 申请号:CN200610068049.6 申请日:2006-03-24
- 公开(公告)号:CN1893014B 公开(公告)日:2010-12-08
- 发明人: 原孝介
- 申请人: 冲电气工业株式会社
- 申请人地址: 日本东京
- 专利权人: 冲电气工业株式会社
- 当前专利权人: 拉碧斯半导体株式会社
- 当前专利权人地址: 日本东京
- 代理机构: 中国国际贸易促进委员会专利商标事务所
- 代理人: 王以平
- 优先权: 2005-188521 2005.06.28 JP
- 主分类号: H01L21/762
- IPC分类号: H01L21/762
To provide a method for stably forming a device separation layer in a thin semiconductor layer and prevent formation of a bird's beak. The method for forming the device on a semiconductor substrate having a support substrate and the semiconductor layer above the support substrate is provided with: a step for preparing the semiconductor substrate where a transistor forming region and an element separation region are set; a step for forming a pad oxide film on the semiconductor layer of the semiconductor substrate; a step for forming an oxidation-resistant mask layer on the pad oxide film; a step for forming a resist mask covering the transistor forming region on the oxidation-resistant mask layer; a first etching step for etching the oxidation-resistant mask layer with the resist mask as amask and exposing the pad oxide film of the element isolation region; and a step for removing the resist mask, oxidizing the semiconductor layer below the pad oxide film exposed with the exposed oxidation-resistant mask layer as the mask by a LOCOS method and forming the element separation layer.
公开/授权文献:
- CN1893014A 半导体元件的制作方法 公开/授权日:2007-01-10
IPC结构图谱:
H | 电学 |
--H01 | 基本电气元件 |
----H01L | 半导体器件;其他类目未包含的电固体器件 |
------H01L21/00 | 专门适用于制造或处理半导体或固体器件或其部件的方法或设备 |
--------H01L21/67 | .专门适用于在制造或处理过程中处理半导体或电固体器件的装置;专门适合于在半导体或电固体器件或部件的制造或处理过程中处理晶片的装置 |
----------H01L21/71 | ..限定在组H01L21/70中的器件的特殊部件的制造 |
------------H01L21/76 | ...组件间隔离区的制作 |
--------------H01L21/762 | ....介电区 |