
基本信息:
- 专利标题: 适于复杂曲面表面的微纳米压痕试验测试方法
- 专利标题(英):Micro-nano indentation test method suitable for complex curved surface
- 申请号:CN201911104813.4 申请日:2019-11-13
- 公开(公告)号:CN110736670A 公开(公告)日:2020-01-31
- 发明人: 王顺博 , 赵宏伟 , 李思锐 , 王赵鑫 , 王赫
- 申请人: 吉林大学
- 申请人地址: 吉林省长春市前进大街2699号
- 专利权人: 吉林大学
- 当前专利权人: 吉林大学
- 当前专利权人地址: 吉林省长春市前进大街2699号
- 代理机构: 吉林长春新纪元专利代理有限责任公司
- 代理人: 王怡敏
- 主分类号: G01N3/42
- IPC分类号: G01N3/42 ; G01N3/08
The invention relates to a micro-nano indentation test method suitable for a complex curved surface, and belongs to the technical field of material micro-mechanical property test. According to the method, the surface topography of a material with the complex curved surface is scanned based on a three-dimensional contourgraph, surface topography information of the material is obtained, the inclination angle of a plane where a test piece is located is adjusted to rapidly find an area suitable for indentation test, indentation test is then carried out the area, and the material does not need cutting, grinding and polishing of an original process. The problems that there is a prefabricated processing hardening defect of the surface of the test piece and test piece preparation is tedious and complex in existing leveling of the micro-nano indentation test piece are solved. Compared with the prior art, the method of the invention has the advantages of saving test time, being high in materialsurface performance retentivity and the like, being simple in operation and easy to control, and having a wide application prospect in multiple fields.
公开/授权文献:
- CN110736670B 适于复杂曲面表面的微纳米压痕试验测试方法 公开/授权日:2021-10-15
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N3/00 | 用机械应力测试固体材料的强度特性 |
--------G01N3/30 | .用一次冲击力 |
----------G01N3/42 | ..用压头在稳定载荷下压印,例如球形压头,棱锥形压头 |