
基本信息:
- 专利标题: 一种IGBT功率单元免拆卸检测装置
- 专利标题(英):Disassembly-free detection device for IGBT power unit
- 申请号:CN201810574986.1 申请日:2018-06-06
- 公开(公告)号:CN110632486A 公开(公告)日:2019-12-31
- 发明人: 渠学景 , 程铁汉 , 高树同 , 武可 , 王胜坤 , 张伟华 , 陈素红
- 申请人: 北京平高清大科技发展有限公司 , 平高集团有限公司 , 国家电网有限公司 , 国网山东省电力公司电力科学研究院
- 申请人地址: 北京市海淀区中关村东路8号东升大厦AB座8层815A单元
- 专利权人: 北京平高清大科技发展有限公司,平高集团有限公司,国家电网有限公司,国网山东省电力公司电力科学研究院
- 当前专利权人: 北京平高清大科技发展有限公司,平高集团有限公司,国家电网有限公司,国网山东省电力公司电力科学研究院
- 当前专利权人地址: 北京市海淀区中关村东路8号东升大厦AB座8层815A单元
- 代理机构: 郑州睿信知识产权代理有限公司
- 代理人: 陈浩
- 主分类号: G01R31/26
- IPC分类号: G01R31/26
The invention relates to a disassembly-free detection device for an IGBT power unit. The disassembly-free detection device comprises a control mechanism and a test article control power supply unit; the control mechanism is in control connection with the test article control power supply unit; the control mechanism is provided with a communication interface which is in communication connection with a test article control loop; the test article control power supply unit is provided with a power supply interface used for being in power supply connection with a test article energy taking loop; the control mechanism is used for controlling the test article control power supply unit to supply power to the test article energy taking loop; and the control mechanism is used for communicating withthe test article control loop to judge whether the voltage/current output by the test article control power supply unit meets the test requirement and whether the test article energy taking loop is normal or not. According to the disassembly-free detection device for the IGBT power unit provided by the invention, by adjusting the output range of the voltage or current of the test article control power supply unit for supplying power to the test article energy taking loop, the control mechanism communicates with the test article control loop to judge whether the voltage or current of the test article control power supply unit meets the test article requirement, results of normal, under-voltage and overvoltage are obtained, and the test article energy taking loop test is realized without disassembly.
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01R | 测量电变量;测量磁变量(通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
------G01R31/00 | 电性能的测试装置;电故障的探测装置;以所进行的测试在其他位置未提供为特征的电测试装置 |
--------G01R31/26 | .单个半导体器件的测试 |