
基本信息:
- 专利标题: 多晶硅薄膜沉积系统及方法
- 专利标题(英):Polycrystalline silicon film deposition system and method
- 申请号:CN201910794126.3 申请日:2019-08-27
- 公开(公告)号:CN110592666A 公开(公告)日:2019-12-20
- 发明人: 郭帅 , 王秉国 , 吴功莲 , 蒲浩 , 潘国卫
- 申请人: 长江存储科技有限责任公司
- 申请人地址: 湖北省武汉市洪山区东湖开发区关东科技工业园华光大道18号7018室
- 专利权人: 长江存储科技有限责任公司
- 当前专利权人: 长江存储科技有限责任公司
- 当前专利权人地址: 湖北省武汉市洪山区东湖开发区关东科技工业园华光大道18号7018室
- 代理机构: 北京汉之知识产权代理事务所
- 代理人: 陈敏
- 主分类号: C30B28/14
- IPC分类号: C30B28/14 ; C30B29/06 ; C23C16/455 ; C23C16/24 ; H01L21/67
The invention provides a polycrystalline silicon film deposition system and method. The polycrystalline silicon film deposition system comprises a wafer loading chamber, a process chamber, an oxygen-containing gas supply device and a protective gas supply device, wherein the process chamber communicates with the loading chamber; the oxygen-containing gas supply device comprises an oxygen-containing gas supply pipeline; one end of the oxygen-containing gas supply pipeline extends into the wafer loading chamber and is used for supplying oxygen-containing gas into the wafer loading chamber at least in the process of transferring wafers from the process chamber to the wafer loading chamber after a polycrystalline silicon film is deposited; the protective gas supply device comprises a protective gas supply pipeline; one end of the protective gas supply pipeline extends into the wafer loading chamber; and the protective gas supply pipeline is used for providing protective gas into the waferloading chamber at least when the oxygen-containing gas supply device does not provide the oxygen-containing gas into the wafer loading chamber. According to the polycrystalline silicon film deposition system, the surfaces of polycrystalline silicon films deposited on the surfaces of the wafers can be oxidized, the adverse effect on the subsequent photoetching process is avoided, and it ensures that the key dimension of the subsequent photoetching process has high uniformity.