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专利标题:
一种基于多层扇束扫描的工业CT扫描方法
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- 专利标题(英):Industrial CT scanning method based on multi-layer fan-beam scanning
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申请号:CN201910274886.1
申请日:2019-04-08
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公开(公告)号:CN109991251A
公开(公告)日:2019-07-09
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发明人:
王远
, 陈云斌
, 胡栋材
, 石正军
, 张成鑫
, 刘清华
, 张小丽
, 李寿涛
, 涂国锋
, 李敬
, 李世根
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申请人:
中国工程物理研究院应用电子学研究所
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申请人地址:
四川省绵阳市游仙区绵山路64号919-1015信箱
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专利权人:
中国工程物理研究院应用电子学研究所
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当前专利权人:
中国工程物理研究院应用电子学研究所
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当前专利权人地址:
四川省绵阳市游仙区绵山路64号919-1015信箱
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代理机构:
北京同辉知识产权代理事务所
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代理人:
张明利
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主分类号:
G01N23/046
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IPC分类号:
G01N23/046
摘要:
本发明涉及一种基于多层扇束扫描的工业CT扫描方法,属于无损检测技术领域,所述工业CT扫描方法为:令投影角度为β,X射线源和线阵探测器在Z=Zdown扫描并采集投影数据,X射线源和线阵探测器沿着Z轴由Z=Zdown同步平移至Z=Zup,采集投影数据,X射线源和线阵探测器同步旋转Δβ并沿着‑Z轴由Z=Zup同步平移至Z=Zdown,采集投影数据,重复,直至投影角度满足π+2γ≤β≤2π,本发明线阵探测器和X射线源组成二维扇束扫描平面,同时,线阵探测器和X射线源在固定投影角度下平移,实现了扫描视野的纵向覆盖,本发明所述扫描方法的旋转角度不超过360°即可完成对被扫描物体的整体扫描,相比于螺旋扫描和旋转‑平移扫描,降低了线阵探测器和X射线源的旋转角度范围,进而降低了系统设计难度。
摘要(英):
The invention relates to an industrial CT scanning method based on multi-layer fan-beam scanning, and belongs to the technical field of nondestructive testing. The industrial CT scanning method includes the steps that the projection angle is made to be beta, an X-ray source and a linear array detector scan at Z=Z and collect projection data, the X-ray source and the linear array detector aresynchronously and horizontally moved from Z=Z to Z=Z along the Z axis and collect the projection data, the X-ray source and the linear array detector are synchronously rotated by delta beta, synchronously and horizontally moved from Z=Z to Z=Z along the -Z axis and collect the projection data, and the steps are repeated until the projection angle satisfies pi+2 gamma<=beta<=2pi. The linear array detector and the X-ray source constitute a two-dimensional fan-beam scanning plane, and meanwhile, the linear array detector and the X-ray source are horizontally moved at the fixed projection angle to achieve longitudinal coverage of the scanning visual field; and overall scanning of a scanned object can be completed with the rotation angle of the scanning method not exceeding 360 degrees, compared with spiral scanning and rotation-horizontally moving scanning, the rotation angle range of the linear array detector and the X-ray source is lowered, and then the difficulty of system design is lowered.