![一种低冲击空间对接密封泄漏测试系统](/CN/2018/1/269/images/201811348794.jpg)
基本信息:
- 专利标题: 一种低冲击空间对接密封泄漏测试系统
- 专利标题(英):System for testing seal leakage of low-impact space docking
- 申请号:CN201811348794.5 申请日:2018-11-13
- 公开(公告)号:CN109341971A 公开(公告)日:2019-02-15
- 发明人: 廖传军 , 陈海鹏 , 陆浩然 , 常晓华 , 孙海亮 , 吴晗玲 , 范书群 , 于秀丽 , 李强 , 介党阳 , 唐颀 , 李佳峰 , 邓梦然
- 申请人: 北京宇航系统工程研究所 , 中国运载火箭技术研究院
- 申请人地址: 北京市丰台区南大红门路1号内35栋
- 专利权人: 北京宇航系统工程研究所,中国运载火箭技术研究院
- 当前专利权人: 北京宇航系统工程研究所,中国运载火箭技术研究院
- 当前专利权人地址: 北京市丰台区南大红门路1号内35栋
- 代理机构: 中国航天科技专利中心
- 代理人: 张辉
- 主分类号: G01M3/20
- IPC分类号: G01M3/20
The invention discloses a system for testing seal leakage of low-impact space docking, comprising a space docking seal leakage test device, a heating/cooling cycle machine, a high pressure helium gascylinder, and a vacuum helium mass spectrometer leakage detector. The heating/cooling cycle machine is used to provide a simulated test environment under various temperature conditions. The high pressure helium cylinder provides a gas source for establishing an in-cabin test pressure on the one hand and a missing gas for the leakage detection on the other hand. The vacuum helium mass spectrometerleakage detector establishes a space vacuum environment on the one hand, and tests a seal leakage rate of a low-impact space docking seal test piece on the other hand. The space docking seal leakage test device is used to mount the low-impact space docking seal test piece, simulate the working state after the docking of the low-impact space docking seal leakage test device, and carry out a leakagerate test under various docking conditions. According to the system for testing the seal leakage of the low-impact space docking, various space working condition environments can be simulated, and the sealing performance is fully verified on the ground.
公开/授权文献:
- CN109341971B 一种低冲击空间对接密封泄漏测试系统 公开/授权日:2021-02-05
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01M | 机器或结构部件的静或动平衡的测试;未列入其他类目的结构部件或设备的测试 |
------G01M3/00 | 结构部件的流体密封性的测试 |
--------G01M3/02 | .应用流体或真空 |
----------G01M3/04 | ..通过在漏泄点检测流体的出现 |
------------G01M3/20 | ...应用特殊示踪物质,例如染料、荧光材料、放射性材料 |