
基本信息:
- 专利标题: 低功率源需求的波导环行器功率试验方法
- 专利标题(英):Waveguide junction circulator power test method with low power source demand
- 申请号:CN201811123210.4 申请日:2018-09-26
- 公开(公告)号:CN109212353A 公开(公告)日:2019-01-15
- 发明人: 王檠 , 袁兴武
- 申请人: 西南应用磁学研究所
- 申请人地址: 四川省绵阳市滨河北路西段268号
- 专利权人: 西南应用磁学研究所
- 当前专利权人: 西南应用磁学研究所
- 当前专利权人地址: 四川省绵阳市滨河北路西段268号
- 代理机构: 绵阳市博图知识产权代理事务所
- 代理人: 杨晖琼
- 主分类号: G01R31/00
- IPC分类号: G01R31/00
The invention discloses a waveguide junction circulator power test method with the low power source demand, and belongs to the technical field of microwave components. The waveguide junction circulator power test method comprises the following steps that a half-cavity structure waveguide junction circulator is made; adapters are made; the three adapters are adopted to be assembled with the half-cavity structure waveguide junction circulator together to form a half-cavity structure test sample; and according to the requirements of a power test, the obtained half-cavity structure test sample isconnected into a power system in the corresponding transmission direction, and the loaded power is about half of the loaded power of a complete structure waveguide junction circulator. Through the waveguide junction circulator power test method, the problems that an average power test and limit power evaluation cannot be carried out due to the lack of a power source of the waveguide junction circulator can be solved; and meanwhile the demands of a waveguide junction circulator power test and a limit power evaluation test for the power source can further be lowered, the test cost is lowered, the harm of the power system to testers is reduced, and protection to the power test system is improved.
公开/授权文献:
- CN109212353B 低功率源需求的波导环行器功率试验方法 公开/授权日:2021-01-26
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01R | 测量电变量;测量磁变量(通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
------G01R31/00 | 电性能的测试装置;电故障的探测装置;以所进行的测试在其他位置未提供为特征的电测试装置 |