![半导体装置及其制造方法](/CN/2017/1/55/images/201710279678.jpg)
基本信息:
- 专利标题: 半导体装置及其制造方法
- 专利标题(英):Semiconductor device and manufacturing method thereof
- 申请号:CN201710279678.1 申请日:2017-04-26
- 公开(公告)号:CN108807531A 公开(公告)日:2018-11-13
- 发明人: 周飞
- 申请人: 中芯国际集成电路制造(上海)有限公司 , 中芯国际集成电路制造(北京)有限公司
- 申请人地址: 上海市浦东新区张江路18号;
- 专利权人: 中芯国际集成电路制造(上海)有限公司,中芯国际集成电路制造(北京)有限公司
- 当前专利权人: 中芯国际集成电路制造(上海)有限公司,中芯国际集成电路制造(北京)有限公司
- 当前专利权人地址: 上海市浦东新区张江路18号;
- 代理机构: 中国国际贸易促进委员会专利商标事务所
- 代理人: 曲瑞
- 主分类号: H01L29/78
- IPC分类号: H01L29/78 ; H01L29/423 ; H01L21/336 ; H01L21/28
The invention discloses a semiconductor device and a manufacturing method thereof and belongs to the semiconductor technical field. The method includes the following steps that: a semiconductor structure is provided, wherein the semiconductor structure includes a substrate and semiconductor fins on the substrate; dummy gate structures are formed on the semiconductor fins; a first dielectric layeris formed on the semiconductor structure after the dummy gate structures are formed, and the first dielectric layer protrudes out from the upper surfaces of the dummy gate structures; the dummy gate structures and portions of the semiconductor fins covered by the dummy gate structures are removed, so that grooves can be formed, wherein the semiconductor fin is divided into a first portion and a second portion separated from each other through the corresponding groove; and a second dielectric layer is formed on the semiconductor structure after the grooves are formed, wherein the second dielectric layer fills the grooves. With the manufacturing method of the present invention adopted, a non-recessed groove isolation structure can be formed.
公开/授权文献:
- CN108807531B 半导体装置及其制造方法 公开/授权日:2021-09-21
IPC结构图谱:
H | 电学 |
--H01 | 基本电气元件 |
----H01L | 半导体器件;其他类目未包含的电固体器件 |
------H01L29/00 | 专门适用于整流、放大、振荡或切换,并具有至少一个电位跃变势垒或表面势垒的半导体器件;具有至少一个电位跃变势垒或表面势垒,例如PN结耗尽层或载流子集结层的电容器或电阻器;半导体本体或其电极的零部件 |
--------H01L29/02 | .按其半导体本体的特征区分的 |
----------H01L29/68 | ..只能通过对一个不通有待整流、放大或切换的电流的电极供给电流或施加电位方可进行控制的 |
------------H01L29/70 | ...双极器件 |
--------------H01L29/762 | ....电荷转移器件 |
----------------H01L29/78 | .....由绝缘栅产生场效应的 |