
基本信息:
- 专利标题: 静电放电失效验证方法
- 专利标题(英):Verification method for electrostatic discharge failure
- 申请号:CN201810240769.9 申请日:2018-03-22
- 公开(公告)号:CN108398631A 公开(公告)日:2018-08-14
- 发明人: 何胜宗 , 王有亮 , 梁晓思 , 陈选龙 , 季启政 , 高志良 , 杨铭
- 申请人: 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) , 北京东方计量测试研究所
- 申请人地址: 广东省广州市天河区东莞庄路110号
- 专利权人: 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)),北京东方计量测试研究所
- 当前专利权人: 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)),北京东方计量测试研究所
- 当前专利权人地址: 广东省广州市天河区东莞庄路110号
- 代理机构: 广州华进联合专利商标代理有限公司
- 代理人: 黄晓庆
- 主分类号: G01R31/28
- IPC分类号: G01R31/28
The invention relates to a verification method for an electrostatic discharge failure. The method comprises the steps that a chip to be verified is subjected to failure analysis, and damage information of the chip to be verified is recorded; damage information of a good-quality chip in the same batch of the chip to be verified is acquired, wherein the damage information of the good-quality chip isobtained after the good-quality chip is subjected to electrostatic discharge simulation damage test analysis; the damage information of the good-quality chip and the damage information of the chip tobe verified are compared and analyzed, and whether or not the electrostatic discharge failure happens to the chip to be verified is judged; when the damage information of the good-quality chip is identical to that of the chip to be verified, it is determined that the electrostatic discharge failure happens to the chip to be verified. According to the verification method for the electrostatic discharge failure, before electrostatic discharge failure analysis, the chip with a suspected electrostatic discharge failure is subjected to electrostatic discharge failure verification, the situation isavoided that an inaccurate result is obtained by directly adopting electrostatic discharge failure analysis, and the reliability of electrostatic discharge failure analysis is improved.
公开/授权文献:
- CN108398631B 静电放电失效验证方法 公开/授权日:2020-10-30
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01R | 测量电变量;测量磁变量(通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
------G01R31/00 | 电性能的测试装置;电故障的探测装置;以所进行的测试在其他位置未提供为特征的电测试装置 |
--------G01R31/28 | .电路的测试,例如用信号故障寻测器 |