
基本信息:
- 专利标题: 一种电子束激发荧光大范围直接探测成像装置及其方法
- 专利标题(英):Electron beam excitation fluorescence large-range direct detection imaging apparatus and a method thereof
- 申请号:CN201611261465.8 申请日:2016-12-30
- 公开(公告)号:CN108279247A 公开(公告)日:2018-07-13
- 发明人: 朱瑞 , 徐军 , 刘亚琪
- 申请人: 北京大学
- 申请人地址: 北京市海淀区颐和园路5号
- 专利权人: 北京大学
- 当前专利权人: 北京金竟科技有限责任公司
- 当前专利权人地址: 北京市海淀区颐和园路5号
- 代理机构: 北京万象新悦知识产权代理事务所
- 代理人: 王岩
- 主分类号: G01N23/2251
- IPC分类号: G01N23/2251 ; G01J1/42 ; G01J1/04
The invention discloses an electron beam excitation fluorescence large-range direct detection imaging apparatus and a method thereof. The imaging apparatus comprises a scanning electron microscope system, a scanning signal generator, a fluorescence collection coupling system, a semiconductor photodetector, a scanning synchronization signal collector and a synergic control and data processing output system. According to the present invention, by using the modular architecture, the configuration adjustment and the subsequent upgrade of each module are flexible and convenient; and by introducingthe large-area semiconductor photoelectric detection chip of the semiconductor photodetector, the fluorescence excited by the scanning electron microscope system in the large imaging visual field range can be concentrated and coupled to the semiconductor photodetector at the same high collection efficiency, such that the problem that the fluorescence excitation intensities or the fluorescence excitation yields at different positions of the image obtained through the large-range fluorescence scanning imaging are difficultly calculated and compared by using the standard is solved so as to complete the large-range rapid detection and analysis based on the electron beam excitation fluorescence signals.
公开/授权文献:
- CN108279247B 一种电子束激发荧光大范围直接探测成像装置及其方法 公开/授权日:2019-07-26
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N23/00 | 利用未包括在G01N21/00或G01N22/00组内的波或粒子辐射来测试或分析材料,例如X射线、中子 |
--------G01N23/02 | .通过使辐射透过材料 |
----------G01N23/225 | ..利用电子或离子微探针 |
------------G01N23/2251 | ...使用入射电子束,例如扫描电子显微镜 |