![X射线荧光光谱的预处理方法及装置](/CN/2017/1/289/images/201711447299.jpg)
基本信息:
- 专利标题: X射线荧光光谱的预处理方法及装置
- 专利标题(英):Method and device for pre-processing X-ray fluorescence spectrum
- 申请号:CN201711447299.5 申请日:2017-12-27
- 公开(公告)号:CN108254400A 公开(公告)日:2018-07-06
- 发明人: 任东 , 沈俊 , 任顺 , 黄应平 , 陆安祥 , 董方敏
- 申请人: 三峡大学
- 申请人地址: 湖北省宜昌市三峡大学路8号
- 专利权人: 三峡大学
- 当前专利权人: 三峡大学
- 当前专利权人地址: 湖北省宜昌市三峡大学路8号
- 代理机构: 北京路浩知识产权代理有限公司
- 代理人: 王莹; 李相雨
- 主分类号: G01N23/223
- IPC分类号: G01N23/223
The invention provides a method and a device for pre-processing an X-ray fluorescence spectrum. The method comprises the following steps: acquiring target spectrum information of soil samples with preset number, wherein the target spectrum information is X-ray fluorescence spectrum information and comprises the absorbance of each wavelength; calculating ideal spectrum information according to eachabsorbance; calculating regression coefficient corresponding to each soil sample according to the ideal spectrum information and the target spectrum information of each soil sample; calculating the absorbance of each soil sample after correction according to the target spectrum information of each soil sample and the regression coefficient corresponding to each soil sample, and determining that the absorbance of each soil sample after correction is the target spectrum information of each soil sample after pre-processing. The X-ray fluorescence spectrum is pre-processed by the method providedby the invention, so that denoising of the spectrum, baseline drift and correction of light scattering can be realized, and the precision and the stability of modeling are improved conveniently.
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N23/00 | 利用未包括在G01N21/00或G01N22/00组内的波或粒子辐射来测试或分析材料,例如X射线、中子 |
--------G01N23/02 | .通过使辐射透过材料 |
----------G01N23/223 | ..通过用X射线辐照样品以及测量X射线荧光 |