![一种半导体器件及制备方法、电子装置](/CN/2016/1/187/images/201610936621.jpg)
基本信息:
- 专利标题: 一种半导体器件及制备方法、电子装置
- 专利标题(英):Semiconductor device, manufacturing method and electronic device
- 申请号:CN201610936621.X 申请日:2016-10-25
- 公开(公告)号:CN107978674A 公开(公告)日:2018-05-01
- 发明人: 刘盼盼 , 张海洋
- 申请人: 中芯国际集成电路制造(上海)有限公司 , 中芯国际集成电路制造(北京)有限公司
- 申请人地址: 上海市浦东新区张江路18号
- 专利权人: 中芯国际集成电路制造(上海)有限公司,中芯国际集成电路制造(北京)有限公司
- 当前专利权人: 中芯国际集成电路制造(上海)有限公司,中芯国际集成电路制造(北京)有限公司
- 当前专利权人地址: 上海市浦东新区张江路18号
- 代理机构: 北京市磐华律师事务所
- 代理人: 高伟; 冯永贞
- 主分类号: H01L45/00
- IPC分类号: H01L45/00
The invention relates to a semiconductor device, a manufacturing method and an electronic device. The method comprises steps: a semiconductor substrate is provided, multiple layers of laminated structures are formed on the semiconductor substrate, and the laminated structure in each layer comprises a bottom electrode layer and an isolation layer which are laminated sequentially; the laminated structure is patterned to the semiconductor substrate to form a plurality of grooves and laminated structure units isolated through the grooves in the laminated structure; an insulating layer and a sacrificial layer are formed on the side wall of the laminated structure unit and the bottom part of the groove; the sacrificial layer is patterned to form a plurality of mutually-spaced parts in the extending part of the laminated structure unit; and a top electrode layer is formed on the sacrificial layer to cover the sacrificial layer. Through the method of the invention, the contour performance of the groove can be improved, the performance of a 3D RRAM is improved, and the functional losses are reduced.