The invention relates to a method for measuring a capacitance value CM of a capacitive sensor element by means of an integration method, wherein a terminal of the sensor element is electrically connected to a first terminal of an integration capacitor having a known capacitance value CI, which is high by comparison with the capacitance value CM of the sensor element, at a common circuit node, andwherein after a number IZ of integration cycles have been carried out, a voltage UCI at the integration capacitor is measured by means of an A/D converter. The method according to the invention comprises the method steps of: a) defining a number N of integration cycles to be carried out at a start value NStart and determining an end value NEnd for the number N of integration cycles to be carried out b) initializing a voltage sum value UGes to the value of zero c) initializing the number IZ of executed integration cycles to the value of zero d) connecting the common circuit node (3) and a second terminal (2'') of the integration capacitor (2) to an earth potential GND e) carrying out the integration method until the number IZ of executed integration cycles has reached the number N of integration cycles to be carried out f) adding the voltage value UCI(N) currently determined by means of the A/D converter, to the voltage sum value UGes g) increasing the number N by a value n, wherein n is greater than or equal to 1 and is less than NDiff = NEnd - NStart , h) repeating the method steps from step e) until the number N exceeds the determined end value NEnd i) evaluating the voltage sumvalue UGes as the measurement result.