
基本信息:
- 专利标题: 显示装置及其测试方法
- 申请号:CN201611195850.7 申请日:2016-12-21
- 公开(公告)号:CN107808930B 公开(公告)日:2019-06-18
- 发明人: 边铉泰 , 宋垠妸 , 金仲基 , 赵光男
- 申请人: 乐金显示有限公司
- 申请人地址: 韩国首尔
- 专利权人: 乐金显示有限公司
- 当前专利权人: 乐金显示有限公司
- 当前专利权人地址: 韩国首尔
- 代理机构: 北京集佳知识产权代理有限公司
- 代理人: 蔡胜有; 董文国
- 优先权: 10-2016-0111737 2016.08.31 KR
- 主分类号: H01L51/50
- IPC分类号: H01L51/50 ; H01L51/52 ; G01R31/26
A display device and a testing method thereof are disclosed, in which a defect caused by an overflow of an organic film (292) constituting an encapsulation film (290) can be detected. The display device comprises a substrate (111) including a display area (DA) where pixels are arranged, and a pad area (PA) including a plurality of pads formed outside the display area; an encapsulation film (290) covering the display area, including at least one inorganic film (291) and at least one organic film (292); a dam (120) arranged between the display area and the pad area; and a conductive testing line (130) arranged between the dam (120) and the pad area (PA) and not electrically connected with another conductive line or electrode arranged on the substrate (111).
公开/授权文献:
- CN107808930A 显示装置及其测试方法 公开/授权日:2018-03-16