The invention relates to a vertical probe. The vertical probe has a probe tail, a probe body and a probe head used for performing point contact on an object to be detected and also comprises a structure member, an insulation layer and a conductive member which are mutually fixed. The insulation layer fully separates a conductive member from a structure member, so that the conductive member is insulated from the structure member. The structure member comprises the probe tail and at least part of the probe body, and the conductive member comprises at least part of the probe head, or the structure corresponds to the shapes of the probe tail, the probe body and the probe head. The insulation layer wraps at least part of the structure and is positioned on the probe head. The conductive member is a conductive layer wrapping at least part of the insulation layer and is arranged on the probe head and is used for contacting the object to be detected. As a result, the vertical probe can accord with high frequency testing requirements and is easy to assemble. The invention provides a manufacture method for the vertical probes and the probe head and the probe card which use the vertical probe.