![一种成像装置、成像方法及成像系统](/CN/2017/1/185/images/201710928976.jpg)
基本信息:
- 专利标题: 一种成像装置、成像方法及成像系统
- 专利标题(英):Imaging device, imaging method and imaging system
- 申请号:CN201710928976.9 申请日:2017-10-09
- 公开(公告)号:CN107796837A 公开(公告)日:2018-03-13
- 发明人: 王鹏 , 丁致远 , 高斯 , 宋苾莹
- 申请人: 南京大学
- 申请人地址: 江苏省南京市栖霞区仙林大道163号
- 专利权人: 南京大学
- 当前专利权人: 南京大学
- 当前专利权人地址: 江苏省南京市栖霞区仙林大道163号
- 代理机构: 南京知识律师事务所
- 代理人: 蒋海军
- 主分类号: G01N23/205
- IPC分类号: G01N23/205
The invention discloses an imaging device, an imaging method and an imaging system, and belongs to the technical field of acquisition of sample image data and imaging. The imaging device comprises a charged particle source, a convergence system, a scanning and controlling system, a detecting module and a spectrum analysis module, wherein the spectrum analysis module is placed below the detecting module; the detecting module comprises a plurality of pixilated detector units; and a hole is formed in the detecting module. The imaging device comprises the detecting module with the hole and the spectrum analysis module. A diffraction pattern is obtained by the detecting module with the hole, the spectrum analysis module carries out spectrum analysis on charged particle beams which penetrates through the opening, primary scanning is realized, and meanwhile, the diffraction pattern and spectrum signals are obtained. The imaging method is based on a hollow stacking imaging method, the diffraction pattern obtained by the detecting module with the hole is imaged, and the imaging effect is good.
公开/授权文献:
- CN107796837B 一种成像装置、成像方法及成像系统 公开/授权日:2019-10-29
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N23/00 | 利用未包括在G01N21/00或G01N22/00组内的波或粒子辐射来测试或分析材料,例如X射线、中子 |
--------G01N23/02 | .通过使辐射透过材料 |
----------G01N23/205 | ..利用衍射相机 |