
基本信息:
- 专利标题: 一种用于印刷电路板的EMC二维扫描成像系统
- 专利标题(英):EMC two-dimensional scanning imaging system used for printed circuit board
- 申请号:CN201710422610.4 申请日:2017-06-07
- 公开(公告)号:CN107271881A 公开(公告)日:2017-10-20
- 发明人: 闻映红 , 曹鹤飞 , 任杰 , 陈嘉祥
- 申请人: 北京交通大学
- 申请人地址: 北京市海淀区上园村3号
- 专利权人: 北京交通大学
- 当前专利权人: 北京交通大学
- 当前专利权人地址: 北京市海淀区上园村3号
- 代理机构: 北京正理专利代理有限公司
- 代理人: 付生辉; 戴元毅
- 主分类号: G01R31/28
- IPC分类号: G01R31/28 ; G01R31/00
The invention discloses an EMC two-dimensional scanning imaging system used for a printed circuit board. The system includes an upper computer and a mechanical scanning system electrically connected with the upper computer, the upper computer is used for sending a motion control instruction and a frequency sweep instruction to the mechanical scanning system, receiving field intensity data transmitted by the mechanical scanning system, and generating a scanned image; the mechanical scanning system includes a motion control unit, a field intensity probe and a spectrometer; the mechanical control unit is used for receiving the motion control instruction of the upper computer and driving the field intensity probe to move to a designated position; and the spectrometer is used for receiving the frequency sweep instruction of the upper computer, reading the field intensity data of the field intensity probe, and uploading to the upper computer. The EMC two-dimensional scanning imaging system used for the printed circuit board can accurately locate an interference source of radiation and assess key IC electromagnetic compatibility, solve the problem of electromagnetic compatibility fundamentally, improve the production efficiency and percent of pass of products, and reduce the cost.
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01R | 测量电变量;测量磁变量(通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
------G01R31/00 | 电性能的测试装置;电故障的探测装置;以所进行的测试在其他位置未提供为特征的电测试装置 |
--------G01R31/28 | .电路的测试,例如用信号故障寻测器 |