![模制产品的制造方法及模制产品](/CN/2017/1/21/images/201710107358.jpg)
基本信息:
- 专利标题: 模制产品的制造方法及模制产品
- 专利标题(英):Manufacturing Method Of Molded Product And Molded Product
- 申请号:CN201710107358.8 申请日:2017-02-27
- 公开(公告)号:CN107204296A 公开(公告)日:2017-09-26
- 发明人: 稻叶祐树
- 申请人: 富士电机株式会社
- 申请人地址: 日本神奈川县川崎市
- 专利权人: 富士电机株式会社
- 当前专利权人: 富士电机株式会社
- 当前专利权人地址: 日本神奈川县川崎市
- 代理机构: 北京铭硕知识产权代理有限公司
- 代理人: 孙昌浩; 李盛泉
- 优先权: 2016-055688 20160318 JP
- 主分类号: H01L21/56
- IPC分类号: H01L21/56 ; H01L23/49
Provided is a molded product manufacturing method, including attachment of attaching a partially exposed member that extends from inside a sealed portion in the molded product to be exposed to outside to a sealing target member that is to be sealed inside the sealed portion in the molded product; injecting of inserting the sealing target member having the partially exposed member attached thereto in a die and injecting a sealing material into the die; adjustment of, in a first time period during which the sealing material is injected, holding the partially exposed member at a position differing from a final position in the molded product and adjusting a flow of the sealing material with an adjusting member attached to the partially exposed member; and hardening the sealing material after the first time period.
IPC结构图谱:
H | 电学 |
--H01 | 基本电气元件 |
----H01L | 半导体器件;其他类目未包含的电固体器件 |
------H01L21/00 | 专门适用于制造或处理半导体或固体器件或其部件的方法或设备 |
--------H01L21/02 | .半导体器件或其部件的制造或处理 |
----------H01L21/027 | ..未在H01L21/18或H01L21/34组中包含的为进一步的光刻工艺在半导体之上制作掩膜 |
------------H01L21/50 | ...应用H01L21/06至H01L21/326中的任一小组都不包含的方法或设备组装半导体器件的 |
--------------H01L21/56 | ....封装,例如密封层、涂层 |