基本信息:
- 专利标题： 样品试管架和样品试管分析系统
- 专利标题（英）：Sample tube rack and sample tube analysing system
- 申请号：CN201611025176.8 申请日：2016-11-15
- 公开(公告)号：CN106970236A 公开(公告)日：2017-07-21
- 发明人： 查尔斯·W·约翰 , 托马斯·克拉夫奇克
- 申请人： 贝克曼考尔特公司
- 申请人地址： 美国加利福尼亚州
- 专利权人： 贝克曼考尔特公司
- 当前专利权人： 贝克曼考尔特公司
- 当前专利权人地址： 美国加利福尼亚州
- 代理机构： 上海华诚知识产权代理有限公司
- 代理人： 汤国华
- 优先权： 15003260.5 20151116 EP
- 主分类号： G01N35/04
- IPC分类号： G01N35/04 ; B01L9/06
A sample tube rack for receiving at least one sample tube comprises an upper part comprising an upper surface, wherein at least one upper opening for receiving the sample tube is provided in the upper surface; an intermediate part comprising an intermediate surface, wherein at least one intermediate opening for receiving the sample tube is provided in the intermediate surface; and a lower part comprising a supporting surface, wherein at least one supporting position for supporting the sample tube is provided in the supporting surface. Therein, the intermediate part is connected to both the upper part and the lower part such that the at least one upper opening is substantially aligned above the at least one intermediate opening and above the at least one supporting position for receiving the at least one sample tube. At least one gripping orifice is provided in a lateral side of the lower part.
公开/授权文献:
- CN106970236B 样品试管架和样品试管分析系统 公开/授权日：2021-11-26