
基本信息:
- 专利标题: 图案化掩膜版、其制备方法及使用其进行激光剥离的方法
- 申请号:CN201710135335.8 申请日:2017-03-09
- 公开(公告)号:CN106910678B 公开(公告)日:2019-05-21
- 发明人: 黄永安 , 卞敬 , 万晓东 , 丁亚江 , 肖琳
- 申请人: 华中科技大学
- 申请人地址: 湖北省武汉市洪山区珞喻路1037号
- 专利权人: 华中科技大学
- 当前专利权人: 华中科技大学
- 当前专利权人地址: 湖北省武汉市洪山区珞喻路1037号
- 代理机构: 华中科技大学专利中心
- 代理人: 周磊; 李智
- 主分类号: H01L21/027
- IPC分类号: H01L21/027
The invention belongs to the field of electronic device preparation processes, and discloses a preparation method of a patterned mask. The method comprises the following steps of 1), depositing a light-absorbing material layer on the first surface of a transparent substrate and performing patterning; 2), performing spin-coating on the second surface of the transparent substrate for obtaining a polymer material layer; and 3), irradiating laser on the first surface of the transparent substrate, wherein in the area which is covered by the light-absorbing material on the substrate, laser energy does not reach a polymer material ablation threshold, the polymer is kept; and the polymer in the area which is not covered by the light-absorbing material on the transparent substrate is ablated by the laser, and patterning is realized after the polymer material layer is ablated. Furthermore the shape of the pattern is same with that of the light-absorbing material deposited on the first surface of the transparent substrate, thereby forming the patterned mask. The preparation method can realize interface adhesion strength regulation after laser lift-off. Through controlling the interface adhesion strength after laser lift-off, a large-area flexible ultrathin device still adheres on a rigid substrate after laser lift-off.
公开/授权文献:
- CN106910678A 图案化掩膜版、其制备方法及使用其进行激光剥离的方法 公开/授权日:2017-06-30
IPC结构图谱:
H | 电学 |
--H01 | 基本电气元件 |
----H01L | 半导体器件;其他类目未包含的电固体器件 |
------H01L21/00 | 专门适用于制造或处理半导体或固体器件或其部件的方法或设备 |
--------H01L21/02 | .半导体器件或其部件的制造或处理 |
----------H01L21/027 | ..未在H01L21/18或H01L21/34组中包含的为进一步的光刻工艺在半导体之上制作掩膜 |