
基本信息:
- 专利标题: 一种结构位移监测系统及相关监测方法
- 专利标题(英):Structural displacement monitoring system and relative monitoring method
- 申请号:CN201710040042.1 申请日:2017-01-18
- 公开(公告)号:CN106767444A 公开(公告)日:2017-05-31
- 发明人: 周光毅 , 赵雪峰 , 韩瑞聪 , 李生元 , 白羽 , 王志强 , 赵传莹 , 王超 , 刘文斗 , 孔令杰
- 申请人: 中国建筑第八工程局有限公司 , 大连理工大学
- 申请人地址: 上海市浦东新区中国(上海)自由贸易试验区世纪大道1568号27层;
- 专利权人: 中国建筑第八工程局有限公司,大连理工大学
- 当前专利权人: 中国建筑第八工程局有限公司,大连理工大学
- 当前专利权人地址: 上海市浦东新区中国(上海)自由贸易试验区世纪大道1568号27层;
- 代理机构: 上海唯源专利代理有限公司
- 代理人: 曾耀先
- 主分类号: G01B11/03
- IPC分类号: G01B11/03 ; G01B11/16
The invention provides a structural displacement monitoring system, wherein, a light transmitting device is used for arranging on the structure which is monitored. The light transmitting device, towards a light projective plane of the light receiving device, is setup for transmitting light on the light projective plane to form an optical spot. The light projective plane is disposed as a angle alpha from the light. A displacement measuring device of the optical spot, towards the light projective plane,is setup for measuring the optical spot displacement Z on the light projective plane for a short interval, and the displacement measuring device of the optical spot is connected with the signal of a structural displacement calculation device, which is used for transmitting the optical spot displacement Z to the displacement measuring device of the optical spot. The structural displacement calculation device is used for calculating the structural displacement *=z*Sina of the structure which is monitored in the direction of perpendicular to the light in a time interval. The invention also provides a relative monitoring method. The structural displacement monitoring system has the advantages of saving both time and labor in monitoring structural displacement, low cost, high precision, accurate and stable monitoring, being capable of real-time recording the change of structural dynamic displacement and being suitable for large-scale application.
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01B | 长度、厚度或类似线性尺寸的计量;角度的计量;面积的计量;不规则的表面或轮廓的计量 |
------G01B11/00 | 以采用光学方法为特征的计量设备 |
--------G01B11/02 | .用于计量长度、宽度或厚度 |
----------G01B11/03 | ..通过测量各点的坐标 |