
基本信息:
- 专利标题: 一种双重包覆壳层隔绝针尖的制备方法
- 专利标题(英):Preparation method for isolated needle point with housing layers wrapped in dual manner
- 申请号:CN201610896305.4 申请日:2016-10-14
- 公开(公告)号:CN106645809A 公开(公告)日:2017-05-10
- 发明人: 李剑锋 , 黄亚萍 , 黄声超
- 申请人: 厦门大学
- 申请人地址: 福建省厦门市思明南路422号
- 专利权人: 厦门大学
- 当前专利权人: 厦门大学,厦门大学深圳研究院
- 当前专利权人地址: 福建省厦门市思明南路422号
- 代理机构: 厦门南强之路专利事务所
- 代理人: 马应森
- 主分类号: G01Q70/16
- IPC分类号: G01Q70/16 ; G01N21/65 ; C25F3/02 ; C23C16/40 ; C23C16/455
The invention provides a preparation method for an isolated needle point with housing layers wrapped in dual manner, which relates to a scanning probe. The method comprises the following steps: 1) using a chemical etching method to prepare a needle point; 2) wrapping the surface of the needle point with a housing layer; and 3) using high polymer materials to package the part of the needle point wrapped by the housing layer in step 2 excluding the needle point end for a second time to obtain an isolated needle point with the housing layers wrapped in a dual manner. According to the invention, an atomic layer deposition technique is adopted and different source precursors are used so that the needle point surface can be wrapped by different inert housings. Through the control over the number of circulation turns of different source precursors, the thickness of the housing layer can be accurately controlled. The wrapping in dual manner can prevent the non-analyte molecules in the solution from interfering with the signal generated at the needle point and can isolate the interference of the Faraday current. Therefore, the method can be applied to electrochemical needle-enhanced Raman spectroscopy, electrochemical scanning tunneling microscope and electrochemical scanning microscope. Capable of being universally applied, the method can also be used to the wrapping of other needle points, like silver needle points, AFM needle points, and platinum iridium needle points. The method is simple to perform and is suitable for large batch production.
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01Q | 扫描探针技术或设备;扫描探针技术的应用,例如,扫描探针显微术 |
------G01Q70/00 | SPM探针的一般方面,其制造或有关的使用仪器,它们不专门适用于包括在大组G01Q60/00中的单独的SPM技术 |
--------G01Q70/16 | .探针制造 |