
基本信息:
- 专利标题: 一种基于FPGA的纳秒级脉冲宽度测量装置及方法
- 专利标题(英):Nanosecond pulse width measurement device based on FPGA and method
- 申请号:CN201611036503.X 申请日:2016-11-15
- 公开(公告)号:CN106501622A 公开(公告)日:2017-03-15
- 发明人: 李立功 , 任水生 , 杜念文 , 刘宝东 , 杨帆
- 申请人: 中国电子科技集团公司第四十一研究所
- 申请人地址: 山东省青岛市经济技术开发区香江路98号
- 专利权人: 中国电子科技集团公司第四十一研究所
- 当前专利权人: 中国电子科技集团公司第四十一研究所
- 当前专利权人地址: 山东省青岛市经济技术开发区香江路98号
- 主分类号: G01R29/02
- IPC分类号: G01R29/02
The invention provides a nanosecond pulse width measurement device based on a FPGA and a method. When pulse width measurement is carried out, a double-channel time interval measurement mode is employed, one channel utilizes a rising edge of an input pulse to carry out synchronization for a gate, the other channel utilizes a falling edge of the input pulse to carry out synchronization for a gate, the synchronization gates are both inputted to the FPGA, the FPGA is used for monitoring the two paths of synchronization gates, when signals of the two paths of synchronization gates are monitored to be high, after delay for a time segment, the synchronization gates of the two channels are pulled down, so the new synchronization measurement gates of the two channels are acquired, time counting and TDC interpolation compensation for the new synchronization gates inputted to the corresponding channels are carried out by each corresponding channel, and the width data of the synchronization gates is acquired; subtraction operation for the two paths of synchronization gates is carried out to acquire the pulse width data of the input pulse. The method is advantaged in that smallest pulse width which can be measured is lower than 1 nanosecond.
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01R | 测量电变量;测量磁变量(通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
------G01R29/00 | 不包括在G01R19/00至G01R27/00各组中的电量的测量或指示装置 |
--------G01R29/02 | .单个脉冲特性的测量,如脉冲平度的偏差、上升时间、持续时间 |