
基本信息:
- 专利标题: 基于不同频率介损比值的XLPE绝缘老化状态评估方法
- 申请号:CN201610404171.X 申请日:2016-06-08
- 公开(公告)号:CN105866647B 公开(公告)日:2018-08-31
- 发明人: 刘英 , 王林杰 , 肖阳 , 苏宇 , 廖一帆 , 张福增 , 王国利
- 申请人: 西安交通大学 , 南方电网科学研究院有限责任公司
- 申请人地址: 陕西省西安市咸宁路28号
- 专利权人: 西安交通大学,南方电网科学研究院有限责任公司
- 当前专利权人: 西安交通大学,南方电网科学研究院有限责任公司
- 当前专利权人地址: 陕西省西安市咸宁路28号
- 代理机构: 西安智大知识产权代理事务所
- 代理人: 何会侠
- 主分类号: G01R31/12
- IPC分类号: G01R31/12
The invention provides an XLPE (Cross Linked Polythylene) insulation aging estimation method based on different frequency and dielectric loss ratios. The method comprises the following steps: preparing inner, middle and outer section samples of a cable insulator; performing sample dielectric loss measurement under voltages of 50Hz and 0.1Hz under the same conditions; acquiring the dielectric loss ratio of each sample under 0.1Hz and 50Hz; on the basis of the dielectric loss ratios, calculating to obtain dielectric loss ratios of all insulation layers and the overall insulator; estimating the aging state of an alternating-current or direct-current cable XLPE insulator according to the sizes and change rules of dielectric loss ratios of all the layers and the size of a dielectric loss ratio of the overall insulator. According to the method, influence of non-uniform aging of different positions can be eliminated, so that the overall state of the simulator can be well reflected, and the aging degree of an alternating-current or direct-current cable XLPE insulator can be accurately estimated; the amount of samples required for test is less, and the requirements on voltage and capacity of a test instrument are low; the dielectric loss ratios under different frequencies are taken as character parameters, so that the influence of the test instrument on system errors and external environment is reduced; comparison with historical data is not needed, and engineering application is convenient.
公开/授权文献:
- CN105866647A 基于不同频率介损比值的XLPE绝缘老化状态评估方法 公开/授权日:2016-08-17
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01R | 测量电变量;测量磁变量(通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
------G01R31/00 | 电性能的测试装置;电故障的探测装置;以所进行的测试在其他位置未提供为特征的电测试装置 |
--------G01R31/12 | .测试介电强度或击穿电压 |