The invention relates to an intelligent electric meter embedded application-orientated test method. The method includes memory chip unit testing and metering chip unit testing. The memory chip unit testing includes the following steps that: blocked storage of different data by a memory chip is tested, and storage strategies when an EEPROM cannot be written are tested; whether important data of an intelligent electric meter are backed-up is tested; damaged important data of the memory can be self recovered is tested; and whether overflow errors exist in storage data is tested. The metering chip unit testing includes the following steps that: whether metering parameters can be set normally in the electrification of the electric meter is tested; whether a metering chip is monitored in the normal work of the intelligent electric meter is tested; and the influence of inputted abnormal metering data on an electric meter system is tested. With the above testing processes adopted, the reliability of intelligent electric meter embedded software can be analyzed comprehensively in a detailed manner. With the method provided by the technical schemes of the invention adopted, the quality of the electric meter software can be effectively controlled, potential safety hazards existing in the electric meter software can be eliminated, and problems such as a problem of inconsistency of the functions of the electric meter software can be solved.