An embodiment of the invention discloses a sample stage for electron backscatter diffraction instruments, and relates to the field of rock sample analysis and tests. The sample stage is characterized in that a 70-degree included angle is formed between a fixing plane of the sample stage and a base, a groove is formed in the fixing plane and is used for mounting and fixing a slice sample, and the size of the groove is matched with that of the slice sample; the depth of the groove is consistent with the thickness of the slice sample, and to-be-measured surfaces of the slice sample and the surface of the fixing plane are positioned on the same plane when the slice sample is mounted in the groove. A standard sample groove for mounting a single-crystal silicon standard sample is formed in the fixing plane, the depth of the standard sample groove is consistent with the thickness of the single-crystal silicon standard sample, to-be-measured surfaces of the single-crystal silicon standard sample and the surface of the fixing plane are positioned on the same plane when the single-crystal silicon standard sample is mounted in the standard sample groove. The sample stage has the advantages that the safety of experiments can be guaranteed, and requirements on carrying out tests with the standard sample on samples with large sizes and poor electric conductivity can be met; the sample stage is applicable to the tests with the standard sample on the samples with the large sizes and the poor electric conductivity.