The invention relates to a data storing and processing circuit, and belongs to the technical field of storage testing under bad conditions. Loss of programming, writing-in and storing uncompleted data in the buffer RAM of NAND flash and data in an FIFO buffer when an acquisition and storage circuit abruptly powered off is avoided. A ferroelectric memory is used to realize synchronized circulation storage of acquired data and complete preservation of lost data in power-off time, and data in the ferroelectric memory is fused in data recorded by the flash through processing to complement the data lost in the power-off time; and power-on and data storage are continuously carried out after multi-time power-off before the NAND flash memory is full until the NAND flash memory is full. The circuit has the advantages of solving of the complete recording problem of acquired data in the abrupt power-off time, multi-time abrupt power-off restart and continuous storage functions, and convenient expansion on the basis of an original storing circuit, and is worth to be adopted and promoted.