![多材料金属电子功函数的测定装置](/CN/2015/1/171/images/201510857724.jpg)
基本信息:
- 专利标题: 多材料金属电子功函数的测定装置
- 专利标题(英):Multi-material metal electronic work function measuring device
- 申请号:CN201510857724.2 申请日:2015-11-30
- 公开(公告)号:CN105403682A 公开(公告)日:2016-03-16
- 发明人: 王新彦 , 牛艳利 , 任海鹏 , 梁思韬 , 朱志杰 , 赵扬 , 张卜闻 , 张道贵 , 宋杨
- 申请人: 国家电网公司 , 国网山西省电力公司吕梁供电公司
- 申请人地址: 北京市西城区长安街86号
- 专利权人: 国家电网公司,国网山西省电力公司吕梁供电公司
- 当前专利权人: 国家电网公司,国网山西省电力公司吕梁供电公司
- 当前专利权人地址: 北京市西城区长安街86号
- 代理机构: 太原高欣科创专利代理事务所
- 代理人: 冷锦超; 吴立
- 主分类号: G01N33/20
- IPC分类号: G01N33/20
The invention provides a multi-material metal electronic work function measuring device, and belongs to the technical field of electronic work function measuring devices. The technical problem of providing a measuring device capable of conveniently measuring electron work functions of metal materials is solved. According to the technical scheme, the multi-material metal electronic work function measuring device comprises ideal diodes of which cathode filaments are made of the metal materials, the output end of a current detector Ia1 is connected with the positive pole of an anode voltage apparatus Ua1 in parallel to be connected with the first input end of a common emitter amplification circuit, the output end of the common emitter amplification circuit is connected with the input end of an analog-to-digital (A/D) converter, the output end of the A/D converter is connected with the input end of a single chip microcomputer, the control end of the single chip microcomputer is connected with a display, and the power supply end of the single chip microcomputer is further connected with a charging device. The multi-material metal electronic work function measuring device is suitable for the field of physical experiment teaching demonstration.
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N33/00 | 利用不包括在G01N1/00至G01N31/00组中的特殊方法来研究或分析材料 |
--------G01N33/20 | .金属 |