
基本信息:
- 专利标题: 电磁波屏蔽用金属箔、电磁波屏蔽材料和屏蔽电缆
- 专利标题(英):Electromagnetic wave shield-use metal foil, electromagnetic wave shield material and shield cable
- 申请号:CN201480037280.1 申请日:2014-02-20
- 公开(公告)号:CN105340376A 公开(公告)日:2016-02-17
- 发明人: 田中幸一郎
- 申请人: JX日矿日石金属株式会社
- 申请人地址: 日本东京都
- 专利权人: JX日矿日石金属株式会社
- 当前专利权人: JX日矿日石金属株式会社
- 当前专利权人地址: 日本东京都
- 代理机构: 中国专利代理(香港)有限公司
- 代理人: 童春媛; 刘力
- 优先权: 2013-139914 2013.07.03 JP
- 国际申请: PCT/JP2014/053976 2014.02.20
- 国际公布: WO2015/001817 JA 2015.01.08
- 进入国家日期: 2015-12-29
- 主分类号: H05K9/00
- IPC分类号: H05K9/00 ; B32B9/00 ; C22C13/00 ; C22C19/03 ; C23C8/12 ; C23C14/06 ; C23C28/00 ; H01B7/17 ; C25D5/12 ; C25D5/50
Provided are an electromagnetic wave shield-use metal foil, electromagnetic wave shield material, and a shield cable which are superior in resistance to corrosion, and which are of low cost. On one surface or both surfaces of a substrate comprising a metal foil (1), a Sn-Ni alloy layer (2) is formed, and an oxide (3) is formed on the surface of the Sn-Ni alloy layer, wherein the Sn-Ni alloy layer includes Sn in 20 to 80% by weight, and is of a thickness of 30 to 500 nm. Depth-direction analysis is performed using XPS with the depth from the outermost surface as Xnm When the atom concentration (in %) of the Sn is ASn(X), the atom concentration (in %) of the Ni is ANi(X), the atom concentration (in %) of oxygen is AO(X), and X when AO(X) = 0 is X0, 30 nm >= X0 >= 0.5 nm is satisfied, and in the interval [0, X0], 0.4 >= [integral]ANi(X)dx/[integral]ASn(X)dx >= 0.05 is satisfied..
公开/授权文献:
- CN105340376B 电磁波屏蔽用金属箔、电磁波屏蔽材料和屏蔽电缆 公开/授权日:2018-11-02
IPC结构图谱:
H | 电学 |
--H05 | 其他类目不包含的电技术 |
----H05K | 印刷电路;电设备的外壳或结构零部件;电气元件组件的制造 |
------H05K9/00 | 设备或元件对电场或磁场的屏蔽 |