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基本信息:
- 专利标题: 用于快速测量取向硅钢片晶粒度及磁畴壁宽度的装置
- 申请号:CN201510887354.7 申请日:2015-12-03
- 公开(公告)号:CN105300859B 公开(公告)日:2018-07-03
- 发明人: 党宁员 , 姚腊红 , 胡守天 , 朱业超 , 程祥威 , 周前华
- 申请人: 武汉钢铁有限公司
- 申请人地址: 湖北省武汉市青山区厂前2号门股份公司机关
- 专利权人: 武汉钢铁有限公司
- 当前专利权人: 武汉钢铁有限公司
- 当前专利权人地址: 湖北省武汉市青山区厂前2号门股份公司机关
- 代理机构: 武汉开元知识产权代理有限公司
- 代理人: 胡镇西
- 主分类号: G01N15/02
- IPC分类号: G01N15/02 ; G01N15/10
The invention discloses a device for rapidly measuring the grain size and magnetic domain wall width of an oriented silicon steel sheet. The device comprises a sample platform and a developing component, wherein the developing component comprises a display window and a contact layer; the display window is a transparent glass plate or a transparent hard plastic plate; a liquid storage cavity used for containing a developing suspension liquid is formed between the display window and the contact layer; the display window is provided with a suspension liquid injection hole used for injecting the developing suspension liquid into the liquid storage cavity and a liquid storage cavity closed hole used for balancing the internal pressure of the liquid storage cavity; the suspension liquid injection hole and the liquid storage cavity closed hole can be opened or closed as needed; a magnet yoke is arranged in the sample platform and is provided with a magnetizing winding; after being electrified, the magnetizing winding is capable of magnetizing the oriented silicon steel sheet put on the sample platform. By virtue of adopting the powder pattern method theory, the device is capable of rapidly measuring the grain size and magnetic domain wall width of the oriented silicon steel sheet.
公开/授权文献:
- CN105300859A 用于快速测量取向硅钢片晶粒度及磁畴壁宽度的装置 公开/授权日:2016-02-03
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N15/00 | 测试颗粒的特性;测试多孔材料的渗透性,孔隙体积或者孔隙表面积 |
--------G01N15/02 | .测试颗粒的粒度或粒经分布 |