The present invention relates to a probe device. The probe device comprises a spring sleeve type probe and a probe base, and the probe is equipped with a probe body and a spring sleeve. The spring sleeve is equipped with at least one spring segment and a combining part fixed to the probe body, and the combining part is equipped with a protruding part protruded out of an external cylindrical surface of the spring segment. The probe base is equipped with a plurality of laminated guide plates and at least one guide hole through which the probe penetrates, and comprises a lower guide plate, a supporting guide plate located above the lower guide plate and a supporting hole arranged on the supporting guide plat, and the supporting hole is not circular, and can define a center, a guide surface and a supporting surface. The distance between the supporting surface and the center is greater than the radius of the external cylindrical surface of the spring segment, the distance between the guide surface and the center is greater than the distance between the supporting surface and the center, and is greater than the maximum distance between the protruding part and the center of the probe body, so that the probe can be prevented from swinging or twisting excessively.