
基本信息:
- 专利标题: 缺陷检测装置及偏光片贴附设备
- 专利标题(英):Defect detection device and polaroid attaching equipment
- 申请号:CN201410645979.8 申请日:2014-11-12
- 公开(公告)号:CN104316541A 公开(公告)日:2015-01-28
- 发明人: 孙琦 , 马彬 , 赵秀强
- 申请人: 京东方科技集团股份有限公司 , 北京京东方光电科技有限公司
- 申请人地址: 北京市朝阳区酒仙桥路10号
- 专利权人: 京东方科技集团股份有限公司,北京京东方光电科技有限公司
- 当前专利权人: 京东方科技集团股份有限公司,北京京东方光电科技有限公司
- 当前专利权人地址: 北京市朝阳区酒仙桥路10号
- 代理机构: 北京路浩知识产权代理有限公司
- 代理人: 李相雨
- 主分类号: G01N21/95
- IPC分类号: G01N21/95 ; G06T7/00 ; G06T5/50
The invention provides a defect detection device and a polaroid attaching equipment. The defect detection device comprises a laser emitter and an image acquisition device, wherein the laser emitter is used for illuminating laser to the surface of a panel to be detected; the image acquisition device is used for obtaining height information of different positions in a region subjected to laser illumination according to laser reflected by the region subjected to laser illumination in the surface, and converting the height information into corresponding gray information to obtain a gray image of the region subjected to laser illumination. According to the defect detection device provided by the invention, the laser is emitted to the surface of the panel through the laser emitter at first, then the gray image of the region subjected to laser illumination is obtained according to the laser reflected by the surface of the panel to be detected through the image acquisition device, and the heights of different positions in the obtained gray image are displayed through different gray scales, so that the defect information in the illuminated region can be institutively reflected and the surface defect detection reliability of the panel is improved.
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N21/00 | 利用光学手段,即利用红外光、可见光或紫外光来测试或分析材料 |
--------G01N21/01 | .便于进行光学测试的装置或仪器 |
----------G01N21/88 | ..测试瑕疵、缺陷或污点的存在 |
------------G01N21/95 | ...特征在于待测物品的材料或形状 |