![差分电流采样电路](/CN/2012/1/80/images/201210400008.jpg)
基本信息:
- 专利标题: 差分电流采样电路
- 专利标题(英):Differential current sampling circuit
- 申请号:CN201210400008.8 申请日:2012-10-20
- 公开(公告)号:CN103777052A 公开(公告)日:2014-05-07
- 发明人: 万建章 , 王纪云 , 王晓娟
- 申请人: 郑州单点科技软件有限公司
- 申请人地址: 河南省郑州市经济技术开发区第八大街信息产业园1228室
- 专利权人: 郑州单点科技软件有限公司
- 当前专利权人: 郑州单点科技软件有限公司
- 当前专利权人地址: 河南省郑州市经济技术开发区第八大街信息产业园1228室
- 主分类号: G01R19/00
- IPC分类号: G01R19/00
The invention discloses a differential current sampling circuit. The sampling current input end of the circuit is connected with the drain of a second NMOS transistor; the voltage output end of the circuit is connected with the source of a first NMOS transistor; the control pulse input end of the circuit is connected with the gate of the first NMOS transistor; the source of a first PMOS transistor is connected with a voltage source, the drain of the first PMOS transistor is connected with the drain of a third NMOS transistor, the gate of the first PMOS transistor is connected with the drain of a fourth NMOS transistor, the drain of the first NMOS transistor and the gate and the drain of the second PMOS transistor; the source of the second PMOS transistor is connected with the voltage source; the gate of the second NMOS transistor is connected with the gate of the third NMOS transistor and the gate of the fourth NMOS transistor; and the source of the second NMOS transistor, the source of the third NMOS transistor and the source of the fourth NMOS transistor are all grounded. The MOS transistor circuit is adopted, so advantages of small integrated circuit occupied area, process compatibility and fast speed can be realized.
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01R | 测量电变量;测量磁变量(通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
------G01R19/00 | 用于测量电流或电压或者用于指示其存在或符号的装置 |