![一种在弯曲应力下测试高温超导带材通流情况的装置](/CN/2013/1/85/images/201310429932.jpg)
基本信息:
- 专利标题: 一种在弯曲应力下测试高温超导带材通流情况的装置
- 专利标题(英):Device for testing through-flow condition of high-temperature superconducting strip under bending stress
- 申请号:CN201310429932.3 申请日:2013-09-18
- 公开(公告)号:CN103529317A 公开(公告)日:2014-01-22
- 发明人: 苏路顺 , 任丽 , 赵翔 , 胡南南 , 宋萌 , 曹昆南 , 王达达
- 申请人: 华中科技大学 , 云南电力试验研究院(集团)有限公司电力研究院
- 申请人地址: 湖北省武汉市洪山区珞喻路1037号
- 专利权人: 华中科技大学,云南电力试验研究院(集团)有限公司电力研究院
- 当前专利权人: 华中科技大学,云南电力试验研究院(集团)有限公司电力研究院
- 当前专利权人地址: 湖北省武汉市洪山区珞喻路1037号
- 代理机构: 华中科技大学专利中心
- 代理人: 曹葆青
- 主分类号: G01R31/00
- IPC分类号: G01R31/00
The invention provides a device for testing the through-flow condition of a high-temperature superconducting strip under the bending stress. The device comprises a cylindrical epoxy body, two connecting mechanisms and a base epoxy plate, wherein the bottom part of the cylindrical epoxy body is fixed on the base epoxy plate and comprises a plurality of equal-height epoxy columns which are arranged in a laminated manner; the diameters of the epoxy columns are increased in sequence from top to bottom; the two connecting mechanisms are same in structure and comprise a main copper piece, a clamping copper piece and a fixed epoxy piece respectively; each main copper piece is provided with an access hole for communicating with external current; the bottom parts of the main copper pieces are arranged on the base epoxy plate; the fixed epoxy pieces are sheathed at the peripheries of the main copper pieces in a slidable manner, and the clamping copper pieces are clamped on the fixed epoxy pieces; the fixed epoxy pieces are provided with first fastening pieces for clamping the copper pieces in a supporting manner. The device provided by the invention has the advantages that the superconducting strip can be bent to be under the epoxy columns with different diameters, so that the continuous measurement of quenching points of the superconducting strip is realized; simultaneously, the test is simple in operating process and high in experiment accuracy.
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01R | 测量电变量;测量磁变量(通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
------G01R31/00 | 电性能的测试装置;电故障的探测装置;以所进行的测试在其他位置未提供为特征的电测试装置 |