基本信息:
- 专利标题： 用于对测量对象的厚度进行测量的装置和方法
- 专利标题（英）：Apparatus and method for measuring the thickness of a measurement object
- 申请号：CN201280018020.0 申请日：2012-03-27
- 公开(公告)号：CN103492831A 公开(公告)日：2014-01-01
- 发明人： A·松他格 , G·基施纳 , H·菲尔迈耶 , F·浩切威马
- 申请人： 微-埃普西龙测量技术有限两合公司
- 申请人地址： 德国奥滕伯格
- 专利权人： 微-埃普西龙测量技术有限两合公司
- 当前专利权人： 微-埃普西龙测量技术有限两合公司
- 当前专利权人地址： 德国奥滕伯格
- 代理机构： 上海专利商标事务所有限公司
- 代理人： 张兰英
- 优先权： 102011017297.1 2011.04.15 DE; 102011107771.9 2011.07.15 DE
- 国际申请： PCT/DE2012/200018 2012.03.27
- 国际公布： WO2012/139571 DE 2012.10.18
- 进入国家日期： 2013-10-11
- 主分类号： G01B7/06
- IPC分类号： G01B7/06 ; G01B11/06 ; G01B21/08
An apparatus for measuring the thickness of a measurement object, preferably a measurement object in the form of a web or piece goods, in a measuring gap, with a measuring mechanism which is fitted to a machine frame, wherein the measuring mechanism for measuring the thickness comprises one or more travel measurement sensor(s) aimed at the measurement object, is characterized in that a compensation sensor which is coupled to a travel measurement sensor measures the distance to a reference rule in order to detect and compensate for a change in the measuring gap, in that the reference rule is in the form of a side of a frame-shaped reference device integrated in the measuring mechanism, and in that the reference device is configured in such a manner that the distance between the reference rule and that side of the reference device which is opposite the reference rule is known during the thickness measurement. A corresponding method for measuring the thickness is also stated.
公开/授权文献:
- CN103492831B 用于对测量对象的厚度进行测量的装置和方法 公开/授权日：2017-04-12
IPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01B | 长度、厚度或类似线性尺寸的计量；角度的计量；面积的计量；不规则的表面或轮廓的计量 |
| ------G01B7/00 | 以采用电或磁的方法为特征的计量设备 |
| --------G01B7/004 | .用于测量各点的坐标 |
| ----------G01B7/06 | ..用于计量厚度 |