
基本信息:
- 专利标题: 基于高低频算法校模的电特大尺寸目标散射预估方法
- 专利标题(英):Electrical oversized target scattering estimation method of mold calibration based on high-frequency and low-frequency algorithms
- 申请号:CN201310065499.X 申请日:2013-03-01
- 公开(公告)号:CN103176082A 公开(公告)日:2013-06-26
- 发明人: 方重华 , 易学勤 , 张崎
- 申请人: 中国舰船研究设计中心
- 申请人地址: 湖北省武汉市武昌区紫阳路268号
- 专利权人: 中国舰船研究设计中心
- 当前专利权人: 中国舰船研究设计中心
- 当前专利权人地址: 湖北省武汉市武昌区紫阳路268号
- 代理机构: 湖北武汉永嘉专利代理有限公司
- 代理人: 胡建平
- 主分类号: G01R31/00
- IPC分类号: G01R31/00
The invention discloses an electrical oversized target scattering estimation method of mold calibration based on high-frequency and low-frequency algorithms. The electrical oversized target scattering estimation method includes 1, estimating electromagnetic scattering characteristics of a low frequency band of a given target based on the high-frequency algorithm; 2, estimating electromagnetic scattering characteristics of a low frequency band of a given target based on the low-frequency algorithm; 3, comparing estimation results of step 1 and step 2, and determining whether a peak value difference and an average difference of the estimation results are in a setting range or not; 4, if not, performing mold calibration of an established mold through the high-frequency algorithm according to the estimation result of the low-frequency algorithm; and 5, if so, estimating the electromagnetic scattering characteristics of a needed high frequency band by using the high-frequency algorithm so as to acquire a result of the target scattering characteristics. By the aid of the electrical oversized target scattering estimation method, accuracy and speed can be balanced, and the electromagnetic scattering characteristics of the electrical oversized target can be estimated accurately and rapidly.
公开/授权文献:
- CN103176082B 基于高低频算法校模的电特大尺寸目标散射预估方法 公开/授权日:2015-06-24
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01R | 测量电变量;测量磁变量(通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
------G01R31/00 | 电性能的测试装置;电故障的探测装置;以所进行的测试在其他位置未提供为特征的电测试装置 |