![一种RFID标签、读写器的多工况检测装置](/CN/2012/1/114/images/201210574884.jpg)
基本信息:
- 专利标题: 一种RFID标签、读写器的多工况检测装置
- 专利标题(英):Multi working condition detection device of radio frequency identification (RFID) labels and reader-writer
- 申请号:CN201210574884.2 申请日:2012-12-26
- 公开(公告)号:CN103065171A 公开(公告)日:2013-04-24
- 发明人: 尹周平 , 王瑜辉 , 位华伟 , 刘宇峰 , 聂媛
- 申请人: 东莞华中科技大学制造工程研究院 , 东莞思谷数字技术有限公司
- 申请人地址: 广东省东莞市松山湖科技产业园区科技九路1号
- 专利权人: 东莞华中科技大学制造工程研究院,东莞思谷数字技术有限公司
- 当前专利权人: 东莞华中科技大学制造工程研究院,东莞思谷数字技术有限公司
- 当前专利权人地址: 广东省东莞市松山湖科技产业园区科技九路1号
- 代理机构: 北京信慧永光知识产权代理有限责任公司
- 代理人: 田利琼
- 主分类号: G06K17/00
- IPC分类号: G06K17/00
The invention relates to the technical field of radio frequency identification (RFID) detecting equipment, in particular to a multi working condition detection device of RFID labels and a reader-writer. The multi working condition detection device of the RFID labels and the reader-writer is composed of a label swivel plate and a reader-writer chuck arranged above the label swivel plate. The label swivel plate is a swivel plate which is driven by a motor. A plurality of label clamps are evenly distributed on the circumference of the swivel plate. The swivel plate is further provided with an environmental simulation device. When the multi working condition detection device of the RFID labels and the reader-writer is used in a test, corresponding to-be-tested RFID labels are arranged on the label clamps, the reader-writer is arranged on the reader-writer chuck, corresponding rotating speed is adjusted through the motor, a corresponding detecting environment is adjusted to through an environment simulator, then needed detecting environment can be formed, and detecting work can be carried out on the RFID labels and the reader-writer. The multi working condition detection device of the RFID labels and the reader-writer has the advantages of being simple in structure, capable of applying to tests of the RFID labels and the reader-writer under different working conditions, free from the need of tests in relevant factories, simple in test and low in test cost.