基本信息:
- 专利标题： X射线成像装置和X射线成像方法
- 申请号：CN201080004291.1 申请日：2010-01-15
- 公开(公告)号：CN102272860A 公开(公告)日：2011-12-07
- 发明人： 向出大平 , 高田一广 , 福田一德 , 渡边壮俊
- 申请人： 佳能株式会社
- 申请人地址： 日本东京
- 专利权人： 佳能株式会社
- 当前专利权人： 佳能株式会社
- 当前专利权人地址： 日本东京
- 代理机构： 中国国际贸易促进委员会专利商标事务所
- 代理人： 卜荣丽
- 优先权： 2009-006848 2009.01.15 JP; 2009-264412 2009.11.19 JP
- 国际申请： PCT/JP2010/050749 2010.01.15
- 国际公布： WO2010/082688 EN 2010.07.22
- 进入国家日期： 2011-07-12
- 主分类号： G21K1/06
- IPC分类号： G21K1/06
Provided is an X-ray imaging apparatus and a method of X-ray imaging, with which the apparatus can be reduced in size and a with which differential phase image or a phase image with consideration of an X-ray absorption effect of an object can be obtained. A displacement of X-rays that have been split by a splitting element and have passed through an object is measured. The displacement can be measured by using a first attenuation element having a transmission amount that continuously changes in accordance with the incident position of X-rays. At this time, an X-ray transmittance of an object that is calculated by using a second attenuation element having a transmission amount that does not change in accordance with the incident position of X-rays is used.
公开/授权文献:
- CN102272860B X射线成像装置和X射线成像方法 公开/授权日：2014-07-30
IPC结构图谱:
| G | 物理 |
| --G21 | 核物理；核工程 |
| ----G21K | 未列入其他类目的粒子或电磁辐射的处理技术；照射装置；γ射线或X射线显微镜 |
| ------G21K1/00 | 辐射或粒子的处理装置，如聚焦、慢化 |
| --------G21K1/06 | .应用衍射、折射或反射，如单色仪 |