A method is described for determining relevance values (R(i,m)), each relevance value representing a relevance of a combination ((i,m)) of an input node (i) of a first number (I) of input nodes with a measurement node (m) of a second number (M) of measurement nodes for a detection of a fault on a chip, the method comprising: applying a third number (K) of tests at the first number (I) of input nodes, wherein each test (k) of the third number (K) of tests defines for each input node (i) a test input choice (U(k,i)); measuring for each test (Jc) of the third plurality (K) of tests a signal at each of the second number (M) of measurement nodes to obtain for each measurement node (m) of the second number (M) of measurement nodes a third number (K) of measurement values, wherein each measurement value (Y(k,m)) is associated to the test (k) it was measured for and to each measurement node (m) it was measured at; and determining the relevance values (R(i,m)), wherein each relevance value is calculated based on a correlation between the third number (K) of test input choices (U(k,i)) defined for the input node (i) of the respective combination and the third number (K) of measurement values (Y(k,m)) associated to the measurement node (m) of the respective combination (i,m).