![射线检测系统以及利用射线进行无损检测物体的方法](/CN/2008/1/45/images/200810227002.jpg)
基本信息:
- 专利标题: 射线检测系统以及利用射线进行无损检测物体的方法
- 专利标题(英):Ray detection system and method for performing nondestructive testing on object by using rays
- 申请号:CN200810227002.9 申请日:2008-11-18
- 公开(公告)号:CN101738406B 公开(公告)日:2012-10-03
- 发明人: 李元景 , 陈志强 , 李荐民 , 吴玉成 , 杨光 , 肖永顺 , 孙尚民 , 张克 , 叶梁 , 苏建军 , 陆宏宇 , 叶青 , 雍涛 , 姜海涛 , 李建军 , 万静 , 何正军 , 王东宇 , 陈少锋 , 周立英
- 申请人: 北京固鸿科技有限公司 , 清华大学 , 同方威视技术股份有限公司
- 申请人地址: 北京市海淀区东王庄路1号同方科技大厦B座27层
- 专利权人: 北京固鸿科技有限公司,清华大学,同方威视技术股份有限公司
- 当前专利权人: 北京固鸿科技有限公司,清华大学,同方威视技术股份有限公司
- 当前专利权人地址: 北京市海淀区东王庄路1号同方科技大厦B座27层
- 代理机构: 中国专利代理(香港)有限公司
- 代理人: 张群峰; 何自刚
- 主分类号: G01N23/18
- IPC分类号: G01N23/18
The invention discloses a ray detection system and a method for performing nondestructive testing on an object by using rays. The detection system comprises a radiation source, a detector array, a track, a carrier and a guide rail translation device, wherein the radiation source is used for emitting scanning rays; the detector array is separated from the radiation source along the horizontal direction, is fixedly arranged relative to the radiation source, and is used for receiving the rays emitted by the radiation source; the track passes between the radiation source and the detector array; the carrier is used for carrying the detected object and can do reciprocating motion on the track; and the guide rail translation device is matched with the track, can ensure that the carrier derail the track and is jointed with the guide rail translation device, and can adjust the motion of the carrier between the radiation source and the detector array according to the required ways. The system can realize line production through reasonable design flow so as to greatly improve the detection efficiency; and the system particularly can perform CT tomoscanning on major positions of the detected object so as to accurately judge internal defects.
公开/授权文献:
- CN101738406A 射线检测系统以及利用射线进行无损检测物体的方法 公开/授权日:2010-06-16
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N23/00 | 利用未包括在G01N21/00或G01N22/00组内的波或粒子辐射来测试或分析材料,例如X射线、中子 |
--------G01N23/02 | .通过使辐射透过材料 |
----------G01N23/04 | ..并形成图像 |
------------G01N23/08 | ...利用电检测装置 |
--------------G01N23/18 | ....测试缺陷或杂质存在 |